Professor Aris Christou
Department of Materials Science and Engineering | Department of Mechanical Engineering
A. James Clark School of Engineering | Universty of Maryland
Selected Articles
For a more complete and up to date list, please see Professor Christou's C.V. (PDF)
Gary Paradee, Tom Martin and Aris Christou, “Fatigue Properties of Uniform and Patterned ITO on Flexible Substrates,” J. Microelectronics Reliability, Accepted 2014 and to be published 2015.
T.J. Anderson, K.D. Hobart, J.D. Greenlee, D.I. Shahin, A.D. Koehler, E.A. Imhoff, R.L. Myers-Ward, A. Christou, F.J. Kub, “UV and EUV Detectors Based on the Graphene/SiC Heterojunction." Submitted to Electronic Letters, 2014.
Gary Paradee, Tom Martin, Aris Christou, “Fatigue Properties of Graphene on Flexible Substrates”, IEEE Transactions on Device and Materials Reliability, December 2014.
Gary Paradee, Eric Bailey and A. Christou, “Stress relaxation behavior and low cycle fatigue behavior of bulk SAC 305,” J. Mater. Sci. Electron (2014) 25:4122-4128.
Gary Paradee, Tom Martin, Aris Christou, “Fatigue Properties of Graphene on Flexible Substrates”, IEEE Transactions on Device and Materials Reliability, December 2014.
A. Christou, “Process-Reliability Relationships in GaN and GaAs Field Effect Transistors and HFETs”, Compound Semiconductor Manufacturing Technology, Digest_2013, pp 391-394.
Kaushik Chatterjee, Mohammad Modarres and Joseph B. Bernstein. "Fifty Years of Physics of Failure" (PDF), Journal of the Reliability Informaiton Analysis Center, January 2012
M. Sawant, and A. Christou. "Failure modes and effects criticality analysis and accelerated life testing of LEDs for medical applications." Solid-State Electronics, (2012) 78, 39–45.
Martin Peckerar, Thomas Martin, and Aris Christou. "Nanoparticle Technology for Power Integration With Flexible Substrates."
Christou, A., & Fantini, F. "Introduction to the special issue on GaN and related nitride compound device reliability." IEEE Transactions on Device and Materials Reliability, (2008) 8(2), 239-239.
Christou, A. "Monte Carlo Reliability Model for Microwave Monolithic Integrated Circuits." Quality and Reliability Engineering International, (2008) 24(3), 315-329.
S. Yang, A. Christou, “Failure Model for Silver Electromigration,” IEEE Trans Materials, Device Reliability, Vol2, Feb 2007.
S. Yang, J.Wu, A. Christou, “Initial Stages of Silver Electrochemical Migration Degradation,” Microelectronics Reliability vol.46 (2006) 1915-1921.
C.C. Zhang, Aris Christou, “Reliability of Leadless Interconnects in GaAs ASICS”, J. of RIAC, 2006, No.2, 20-26.
Ahangir Alam, Andrei E. Botchkarev, James A. Griffin, John M. Zavada, Aristos Christou and S. Noor Mohammad, “Optical properties of MBE-grown GaAs1-xNx alloys”, Phil Mag, 1121-1134, 2006.
S. J. Chang, C. F. Shen, S. C. Shei,C. S. Chang, W. S. Chen, T. K. Ko, J.K.Shei and Y. S. Sun, "Highly Reliable Nitride-Based LEDs with Internal ESD Protection Diodes" (PDF), IEEE Transactions on Device and Materials Reliability, November 2005.
L.Mohaddes-Ardahilli, L. Martinez-Miranda, L. Salamanca-Riba, A. Christou, William Bentley and M. Al- Sheikhley, “Preferred Orientation of DNA Olionucleotide probes on the (2x4) Reconstructed Surface of (001) GaAs,” J Appl. Physics Vol 95, No. 11, Part 1 (6021-6024), June 2004.
Mohamad Al-Sheikhley, D. Sweet, Lourdes Salamanca-Riba, B. Varughese, J. Silverman, Aris Christou and William Bentley, “Radiation-Induced Failure Mechanisms of GaAs–Based Biochips,” IEEE Transactions on Device and Materials Reliability, vol. 4, No. 2 (192-197), June 2004.
C. Zhang, P. Yalamanchili, M. Al-Sheikhley and A. Christou, Metal Migration in Epoxy Encapsulated ECL Devices, 2004 ESREF, Oct. 2004.
L.Mohaddes-Ardahilli, L. Martinez-Miranda, J. Silverman, A. Christou, L. Salamanca- Riba and M. Al- Sheikhley, “Attachment of DNA Probes on GaAs Surfaces”, Appl. Physics Lettrs, 83, No. 1, pp. 192-194 (2003).
N. Strifas, P. Yalamanchili, A. Christou, “Reliability Model for Polyimide-Metal Interconnect Shorts,” Qual and Reliability Int. 20:1-13 (2004).
M. Linnik and A. Christou, “Calculations of optical properties for Quartenary III-V semiconductor alloys in the transparent region and above” (PDF), Physica B, 318, pp 140-161 (2002). Abstract »
M. Linnik and A. Christou, “Vertical Cavity Surface Emitting Laser with AlGaInAs/InP Bragg Mirrors Fabricated for Operation at 1.5 mm,” (PDF) IEEE Transactions on Electron Dev. Vol 48, No. 10, pp. 2228-2237 (2001). Abstract »
A. Christou, A Dimoulas, A. Cornet, “Epitaxial Growth Morphologies of AlAsIn/InGaAs heterostructures on non-(100) InP Index Substrates,” Materials Science and Engineering B87 pp. 249-255 (2001). Abstract »
M. Linnik and A. Christou, “Optimization of III-V Compound Semiconductor Heterostructures for Distributed Bragg Reflector Applications in VCSELs,” Materials Science and Engineering B80 pp. 245-247 (2001). Abstract »
M. Linnik and A. Christou, “AlGaInAs/InP and GaInSbAs/Inp Highly Reflective Mirrors for VCSEL Applications Operating at 1.55 microns”, SPIE, vol 4278, pp 125-131 (2001).
A. Christou, “Charge Transport in Low Dimensional Nitride Semiconductor Heterostructures,” Physica B, Vol 296, No. 1-3, pp264-271 (2001).
L. Guan, A. Christou, and D. Barbe, “The Effect of Corrosion on the Performance of High Speed Multi-Chip Module Interconnects,” Quality and Reliability Engineering International, Vol. 16, pp. 1-6 (2000). Abstract »
L. H. Zhu, A. Christou, and D. F. Barbe, “High Temperature Device Performance and Thermal Characteristics of GaAs MESFETs on CVD Diamond Substrates,” Quality and Reliability Engineering International Vol 16: 527-536 (2000). Abstract »
T. Feng, M. Al-Sheikhly, and A. Christou, “Defect Formation in SiGe/Si Structures Grown on GaAs by CVD Techniques Utilizing a Si:H Template Layer,” Materials Science & Engineering, B67, 70-75 (1999). Abstract »
N. Strifas, P. Panayotatos and A. Christou, “Optical Interconnect Reliability”, Optical Engineering (37)8, August 1998.
F. Buot, W. Anderson, A. Christou, A. Campbell and A. Knudson, “A Mechanism of Radiation-Induced Degradation”, J. Appl. Phys. 37, No. 2, pp. 581-590 (1985).
A. Christou and J. E. Davey, “Reliability and Degradation of Active III-V Semiconductor Devices”, in Reliability and Degradation, edited by D. Morgan, Wiley (1981).
A. Christou, “Amorphous Thin Film Diffusion Barriers”, in Interfaces and Contacts, edited by R. Ludeke and K. Rose, North-Holland (1983).
A. Christou, “Reliability and Radiation Effects of HEMT Integrated Circuits and Devices”, in Semiconductor Device Reliability, edited by A. Christou and B.A. Unger, Kluwer Publishing, Netherlands (1989).
